IEEE.org| IEEE Xplore Digital Library | IEEE Standards | IEEE Spectrum | More Sites

Cart (0) | | Sign Out Create Account | Sign In

https://securesso.ieee.org/ieeevendorsso/rest/auth/validatePFToken

https://ieeexplore.ieee.org/servlet/Login?logout=ibplogout

Resource Center

legal-copy

Short Courses and Tutorials

2004 ISSCC Short Courses and Tutorials

2005 ISSCC Short Courses and Tutorials

2006 ISSCC Short Courses and Tutorials

2007 ISSCC Short Courses and Tutorials

2008 ISSCC Short Courses and Tutorials

2009 ISSCC Short Courses and Tutorials

2010 ISSCC Short Courses and Tutorials

2011 ISSCC Short Courses and Tutorials

2012 ISSCC Short Courses and Tutorials

2013 ISSCC Short Courses and Tutorials

2014 ISSCC Short Courses and Tutorials

2015 ISSCC Short Courses and Tutorials

2016 ISSCC Short Courses and Tutorials

2017 ISSCC Short Courses and Tutorials

Webinars

Education

CONFedu - CICCx 2017

CONFedu - ISSCCedu 2018

CONFedu - VLSIx 2016

Podcasts

SSCSedu Lecture Series

Publications

eBooks

Open Access Papers

Join IEEE SSCS
IEEE SSCS Website

/content/rc/sscs/en/publications/open-access-papers/SSCSPUB0200

PDF

SSCS

Compact Modeling of Distributed Effects in 2-D Vertical Tunnel FETs and Their Impact on DC and RF Performances

Posted:

17 Feb 2017

Authors:

Jie Min and Peter M. Asbeck

Page/Slide Count:

Pages: 9

Tags:

open access Distributed Effects RF sscs 2 D Vertical Tunnel FETs Performance 2017 DC JxCDC Compact Modeling

Pricing:

SSCS Members:

IEEE Members:

Non-members:

/content/rc/sscs/en/jcr:content/parthirty/par/rcrecentcontents

/content/rc/sscs/en/publications/open-access-papers/SSCSPUB0200