Universal Charge-Conserving TFET SPICE Model Incorporating Gate Current and Noise

Posted:
20 Jul 2016
Authors:
Hao Lu, Wenjun Li, Yeqing Lu, Patrick Fay, Trond Ytterdal, and Alan Seabaugh
Page/Slide Count:
Pages: 8
Pricing:
SSCS Members:
IEEE Members:
Non-members:

Recent Items