Tunnel FET Analog Benchmarking and Circuit Design

Tunnel FET Analog Benchmarking and Circuit Design
Posted: 20 Mar 2018
Authors:
Hao Lu, Paolo Paletti, Wenjun Li, Patrick Fay, Trond Ytterdal, and Alan Seabaugh
Pages: 7

Pricing:
SSCS Members: Free
IEEE Members: Free
Non-members: Free
Please sign in at the top of the page. If you are not an IEEE member, please create a free account to make a purchase or become a society member to have access to all materials for free.